Texas A&M University 2 credits SCSC
Fundamental concepts of powder X-ray diffraction (XRD) and its applications in quantifying crystalline and amorphous materials in soils, sediments, clays, cement, rocks, and synthetical materials; focus on Full XRD pattern simulation, particularly, the Rietveld quantitative XRD method; introduction of theory of X-ray diffraction, instrumental parameters that determine the XRD peak shape, and parameters of crystal structures and size that determine the peak intensities; basic mathematics on the effects of most parameters on XRD peak shape and intensity. Prerequisites: Graduate classification.
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