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ETEC 3820

Metrology and Statistical Process Control

California State University, Los Angeles 3 credits ETEC

Course Description

Adapting industrial operations to metric system; standards and application; development of instructional materials; and review of Statistical Process Control (SPC). Prerequisite: ETEC 1600 and MATH 2110 Needs Permission to Enroll: No Special Fee Applied: No [3]

Code
ETEC 3820
Credits
3
Subject
ETEC

Programs That Include This Course

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