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E C E 553

Testing and Testable Design of Digital Systems

University of Wisconsin-Madison 3 credits E C E

Course Description

Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.

Code
E C E 553
Credits
3
Subject
E C E

Programs That Include This Course

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