University at Buffalo 3 credits Computer Science & Engineering
A sequel to CSE 497/597, Introduction to VLSI Electronics, the project work for this course includes testing of the chip fabricated in 497/597. Lectures include MOS transistor fundamentals, automatic test pattern generation, design for testability, built-in test techniques, design simulation at switch and gate levels, fault simulation at behavioral levels, software tools and equipment for testing, semi-custom VLSI chips, wafer scale integration, and analog circuit test and diagnosis.
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